Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation

Authors
De Filippo, F de Lisio, C Maddalena, P Lerondel, G Yao, T Altucci, C
Citation
F. De Filippo et al., Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation, APPL PHYS A, 73(6), 2001, pp. 737-740
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN journal
09478396 → ACNP
Volume
73
Issue
6
Year of publication
2001
Pages
737 - 740
Database
ISI
SICI code
0947-8396(200112)73:6<737:DOTDFO>2.0.ZU;2-I
Abstract
Porous-silicon reflectance has been determined over a large energy range, f rom 1 eV to 16 eV, by combining a NIR/visible/UV spectrometer with a new VU V light source as laser-harmonic radiation. The porous-silicon dielectric f unction was deduced from reflectance measurements by Kramers-Kronig analysi s. We point out that, for the first time, laser harmonics have been applied in the optical characterization of materials as a new and suitable alterna tive to synchrotron radiation.