Semi-spherical SiGe/Si nano-structures of a new type are presented. Epitaxi
al islands of 30-40 nm in base diameter and 11 nm in height and having a de
nsity of about 6 x 10(10) cm(-2) were produced on (001) Si by molecular bea
m epitaxial growth of Si/Si(0.5)Geo(0.5) layers with in situ implantation o
f 1-keV As+ ions. It was found by cross-section transmission electron micro
scopy that the islands have a complicated inner structure and consist of a
micro-twin nucleus and semi-spherical nano-layers of various SiGe compositi
ons. The nature of the surface patterning is interpreted by stress relaxati
on through implantation-induced defects.