Intensity modulation in two Mach-Zehnder interferometers using plasma dispersion in silicon-on-insulator

Authors
Dainesi, P Thevenaz, L Robert, P
Citation
P. Dainesi et al., Intensity modulation in two Mach-Zehnder interferometers using plasma dispersion in silicon-on-insulator, APP PHYS B, 73(5-6), 2001, pp. 475-478
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS B-LASERS AND OPTICS
ISSN journal
09462171 → ACNP
Volume
73
Issue
5-6
Year of publication
2001
Pages
475 - 478
Database
ISI
SICI code
0946-2171(200110)73:5-6<475:IMITMI>2.0.ZU;2-O
Abstract
We present comparative measurements of two Mach-Zehnder interferometers, on e with Y-junction couplers and the other with MMI couplers, both developed in silicon-on-insulator technology and using plasma dispersion effect for l ight phase modulation. Measurements of fiber-to-fiber losses, absorption co efficient, output intensity vs. time and extinction ratio vs. frequency hav e been performed at lambda = 1.3 mum and at lambda = 1.55 mum. Results are reported and discussed in this paper.