The presence of copper nanoparticles in alumina and silica modifies their l
uminescence, and the changes in spectra are influenced by variations in the
nanoparticle size distributions. Luminescence signals are sensitive to the
total defect population. Thus the luminescence not only reflects changes c
aused by thermal annealing, which can modify both intrinsic defects and the
copper nanoparticles, but also responds to the method of preparation of th
in film layers. Copper nanoparticle influence on luminescence is reported b
oth for ion-implanted bulk silica and for copper in pulsed laser deposition
within alumina. Luminescence thus potentially offers a non-destructive mon
itor of the layer quality, reproducibility and growth conditions, as well a
s the state and size of the copper nanoparticles.