Polarization effects of imperfections in conducting and dielectric samplesimaged with polarization-sensitive scanning near-field optical microscopy

Authors
Eggers, G Rosenberger, A Held, N Guntherodt, G Fumagalli, P
Citation
G. Eggers et al., Polarization effects of imperfections in conducting and dielectric samplesimaged with polarization-sensitive scanning near-field optical microscopy, APPL PHYS L, 79(24), 2001, pp. 3929-3931
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
24
Year of publication
2001
Pages
3929 - 3931
Database
ISI
SICI code
0003-6951(200112)79:24<3929:PEOIIC>2.0.ZU;2-J
Abstract
The influence of intrinsic birefringence and of surface imperfections on th e polarization of near-field light is investigated in thin films by polariz ation-sensitive scanning near-field optical microscopy in transmission mode . The experimental results will be discussed and a simple simulation algori thm is proposed. (C) 2001 American Institute of Physics.