Radio-frequency single-electron transistor: Toward the shot-noise limit

Citation
A. Aassime et al., Radio-frequency single-electron transistor: Toward the shot-noise limit, APPL PHYS L, 79(24), 2001, pp. 4031-4033
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
24
Year of publication
2001
Pages
4031 - 4033
Database
ISI
SICI code
0003-6951(200112)79:24<4031:RSTTTS>2.0.ZU;2-0
Abstract
We have fabricated an aluminum single-electron transistor and characterized it at frequencies up to 10 MHz by measuring the reflected signal from a re sonant tank in which the transistor is embedded. We measured the charge sen sitivity of this radio-frequency single-electron transistor to be 3.2x10(-6 ) e/root Hz, which corresponds to the uncoupled energy sensitivity of 4.8 ( h) over bar. Our measurements indicate that with further improvements, the radio-frequency single-electron transistor could reach the shot-noise limit estimated to be about 1 (h) over bar. (C) 2001 American Institute of Physi cs.