Electrical properties of nonirradiated and electron-irradiated thin layers
of CdSe, sandwiched between two gold electrodes, were investigated. Thin fi
lms of CdSe, prepared by thermal-vacuum evaporation on glass substrate at a
temperature of 220 degreesC, were subjected to two sessions of irradiation
with 7 MeV electrons to the fluences of 2x10(15) and 4x10(15) e/cm(2), res
pectively. The current-voltage characteristics, recorded at temperatures in
the range 150-350 K, showed that the Ohm's law is followed at low-applied
voltages, in both nonirradiated and irradiated CdSe layers. In the range of
high-applied voltages, the space-charge-limited current (SCLC), controlled
by a Gaussian trap distribution, placed in the vicinity of the Fermi level
, has been identified as the dominant conduction mechanism. An analysis in
the frame of SCLC theory allowed us to obtain the parameters characterizing
the trap distribution and their changes induced by electron irradiation. (
C) 2001 American Institute of Physics.