Temperature-dependent roughness of electronically excited InP surfaces

Topographical evolution of 100 MeV Au8+-ion-irradiated InP surfaces was stu died using atomic-force microscopy (AFM). The surfaces were roughened under dense electronic excitations. Root-mean-square roughness measured from AFM studies showed an exponential saturation behavior with fluence. Sample tem perature during irradiation was found as a parameter to control the amount of roughness on the surface and the evolution of irradiated surface topogra phy is discussed in terms of thermal spike model. (C) 2001 American Institu te of Physics.