Magnetization reversal mechanisms in epitaxial Fe/Si(001) layers with twofold and fourfold magnetic anisotropies

Epitaxially grown iron thin films (thickness: 8 Angstrom < d < 120 Angstrom ) on Si(001) with body centred cubic structure have been structurally and m agnetically studied at room temperature. All films are characterized by fer romagnetic properties as soon as the thickness reaches 4 ML. In-plane uniax ial and cubic magnetic anisotropy constants are measured on samples obtaine d by modifying the incidence angle of evaporating iron flux. The magnetizat ion reversal mechanisms are analyzed by combining longitudinal magneto-opti cal Kerr effect of both parallel and transverse magnetization components. T hese mechanisms are strongly influenced by the nature of the magnetic aniso tropies. (C) 2001 Elsevier Science B.V. All rights reserved.