Dual plasma deposition based on plasma immersion ion implantation and plasm
a deposition is a fledgling technique for the fabrication of functional thi
n films. One of its advantages is the easy adjustment of the ion kinetic en
ergy during the process. It is straightforward to control the ion kinetic e
nergy during the fabrication of conducting thin films on conducting substra
tes by simply varying the negative dc voltage applied to the targets. Howev
er, for the fabrication of insulating thin films or film deposition on insu
lating substrates, charge accumulation makes it difficult for ions to attai
n the proper kinetic energy. In these cases, a pulse or ac voltage is commo
nly employed. In this article, we theoretically investigate the process win
dow in dual plasma deposition with respect to the pulse width and frequency
of the applied voltage to avoid electrical breakdown of the film as well a
s large ion kinetic energy deviation. The model can deal with the depositio
n of insulating thin films on conducting or insulating substrates. (C) 2001
American Vacuum Society.