Multi-aperture extraction system with micro-beamlet switching capability

Citation
Y. Lee et al., Multi-aperture extraction system with micro-beamlet switching capability, NUCL INST A, 474(1), 2001, pp. 86-92
Citations number
4
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
474
Issue
1
Year of publication
2001
Pages
86 - 92
Database
ISI
SICI code
0168-9002(20011121)474:1<86:MESWMS>2.0.ZU;2-Y
Abstract
A novel ion projection lithography (IPL) technique called maskless-micro-be am reduction lithography (MMRL) is being developed at the Lawrence Berkeley National Laboratory. Instead of a thin stencil mask, this new ion projecti on lithography scheme utilizes a thicker universal pattern generator (or be am forming electrode) which contains switchable beamlets. Both single apert ure and nine-aperture beam extraction systems have been used to test the sw itching scheme. In the single aperture case, an ion beam current of 23 nA w as extracted and successfully turned off when a positive voltage was applie d on the second electrode. For the nine-hole system, ion beams were switche d on and off selectively and independently from each other, It has been dem onstrated that electron beam switching can be achieved in a similar manner. (C) 2001 Elsevier Science B.V. All rights reserved.