A novel ion projection lithography (IPL) technique called maskless-micro-be
am reduction lithography (MMRL) is being developed at the Lawrence Berkeley
National Laboratory. Instead of a thin stencil mask, this new ion projecti
on lithography scheme utilizes a thicker universal pattern generator (or be
am forming electrode) which contains switchable beamlets. Both single apert
ure and nine-aperture beam extraction systems have been used to test the sw
itching scheme. In the single aperture case, an ion beam current of 23 nA w
as extracted and successfully turned off when a positive voltage was applie
d on the second electrode. For the nine-hole system, ion beams were switche
d on and off selectively and independently from each other, It has been dem
onstrated that electron beam switching can be achieved in a similar manner.
(C) 2001 Elsevier Science B.V. All rights reserved.