Photon interference x-ray absorption fine structure - art. no. 201101

Citation
Y. Nishino et al., Photon interference x-ray absorption fine structure - art. no. 201101, PHYS REV B, 6420(20), 2001, pp. 1101
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6420
Issue
20
Year of publication
2001
Database
ISI
SICI code
0163-1829(20011115)6420:20<1101:PIXAFS>2.0.ZU;2-E
Abstract
We report about a fine structure in x-ray absorption spectra, named photon interference x-ray absorption fine structure (pi XAFS). pi XAFS is due to t he interference of x-rays inside the sample and extends across absorption e dges. Using a platinum foil pi XAFS was measured in a high precision absorp tion experiment. Excellent agreement with a theoretical pi XAFS simulation is achieved in the energy range for above an absorption edge where photoele ctron XAFS is negligible. pi XAFS provides a method for determination of at omic structure on short- and long-range order scale.