Direct evidence for the trigonal symmetry of shallow phosphorus acceptors in ZnSe - art. no. 205206

Citation
Jj. Davies et al., Direct evidence for the trigonal symmetry of shallow phosphorus acceptors in ZnSe - art. no. 205206, PHYS REV B, 6420(20), 2001, pp. 5206
Citations number
29
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6420
Issue
20
Year of publication
2001
Database
ISI
SICI code
0163-1829(20011115)6420:20<5206:DEFTTS>2.0.ZU;2-4
Abstract
Spin-flip Raman scattering has been used to provide direct experimental evi dence that shallow phosphorus acceptors in relaxed ZnSe epitaxial layers gr own on GaAs lie at sites of predominantly trigonal local symmetry. As a con sequence, the energy of the heavy-hole bound exciton is about 0.45 meV less than that of the light exciton. This splitting is significantly smaller th an (and of opposite sign and different symmetry to) the valence-band splitt ing of 3 meV observed due to the macroscopic biaxial tensile strain in the same specimens, The behavior is in complete contrast to that of nitrogen ac ceptors, for which no trigonal field is observed. The experiments provide c onfirmation of the behavior predicted by previous pseudopotential total-ene rgy calculations for the shallow acceptor states formed by these two differ ent group-V dopants when substituting at selenium sites.