Jj. Davies et al., Direct evidence for the trigonal symmetry of shallow phosphorus acceptors in ZnSe - art. no. 205206, PHYS REV B, 6420(20), 2001, pp. 5206
Spin-flip Raman scattering has been used to provide direct experimental evi
dence that shallow phosphorus acceptors in relaxed ZnSe epitaxial layers gr
own on GaAs lie at sites of predominantly trigonal local symmetry. As a con
sequence, the energy of the heavy-hole bound exciton is about 0.45 meV less
than that of the light exciton. This splitting is significantly smaller th
an (and of opposite sign and different symmetry to) the valence-band splitt
ing of 3 meV observed due to the macroscopic biaxial tensile strain in the
same specimens, The behavior is in complete contrast to that of nitrogen ac
ceptors, for which no trigonal field is observed. The experiments provide c
onfirmation of the behavior predicted by previous pseudopotential total-ene
rgy calculations for the shallow acceptor states formed by these two differ
ent group-V dopants when substituting at selenium sites.