Cross-sectional TEM sample preparation for the analysis of chips of Ti6Al4V - Preparation method and a few results

In order to improve the machinability of Titanium alloys a better understan ding of the chip formation process is needed. Microstructural analysis of c hips produced at high cutting speeds could lead to a first estimation of te mperature and the degree of deformation, if structural changes can be obser ved. Such analysis can be performed by means of TEM only, but microstructur al observations on the cross-section of the chip is essential for this. The refore a method for preparation of cross-sectional TEM specimen from Ti6A14 V chips has been developed. The preparation steps are presented in detail a nd some micrographs from these specimen are given in this work.