Automated detection of particles, clusters and islands in scanning probe microscopy images

Citation
Mjj. Jak et al., Automated detection of particles, clusters and islands in scanning probe microscopy images, SURF SCI, 494(2), 2001, pp. 43-52
Citations number
23
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
494
Issue
2
Year of publication
2001
Pages
43 - 52
Database
ISI
SICI code
0039-6028(20011120)494:2<43:ADOPCA>2.0.ZU;2-3
Abstract
In order to obtain quantitative information from scanning tunnelling micros copy (STM) images, image processing and pattern recognition techniques are very valuable tools. We developed an algorithm which automatically determin es the positions and sizes of small particles and other nanostructures in S TM and atomic force microscopy (AFM) images. This algorithm has been tested and used both in the study of Pd nanoparticles supported on TiO2 and in th e study of diffusing In atoms embedded in a Cu surface. First the original STM image is filtered in order to obtain an image of the background. Subtra cting this 'background' image from the original image eliminates the height variations in the substrate, such as atomic steps. The particles can then be found by discrimination with respect to a threshold height. Once the par ticles are located, their exact position and size are determined and used f or further analysis. (C) 2001 Elsevier Science B.V. All rights reserved.