Quantitative modelling in scanning probe microscopy

Authors
Foster, AS Hofer, WA Shluger, AL
Citation
As. Foster et al., Quantitative modelling in scanning probe microscopy, CURR OP SOL, 5(5), 2001, pp. 427-434
Citations number
54
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE
ISSN journal
13590286 → ACNP
Volume
5
Issue
5
Year of publication
2001
Pages
427 - 434
Database
ISI
SICI code
1359-0286(200110)5:5<427:QMISPM>2.0.ZU;2-G
Abstract
Significant progress has been made in the theoretical modelling of scanning probe microscopy. The models available now are sufficiently refined to pro vide information not only about the surface, but also the probe tip, and th e physical changes occurring during the scanning process. This has signific antly improved the quantitative analysis of experimental and theoretical re sults. Scanning probe microscopes can now be reliably used to analyse event s on the level of single atoms and single electrons. (C) 2001 Elsevier Scie nce Ltd. All rights reserved.