C. Yanar et al., Evolution of microstructure and defect structure in L1(0)-ordered manganese aluminide permanent magnet alloys, INTERMETALL, 9(10-11), 2001, pp. 949-954
Defects produced in massively transformed L1(0)-ordered tau -MnAl have been
characterized by detailed TEM studies. The defect population in massive ta
u -MnAl comprises arrays of overlapping octahedral stacking faults, {111}-c
onjugated microtwins, thermal antiphase boundaries and dislocations. The ge
nesis of these defects has been attributed to atomic attachment faulting on
{111}- and {020}-type facets of the essentially incoherent growth interfac
e between the parent and product phases. The features of the defect genesis
in T-MnAl are discussed with respect to the role of atomic level processes
at solid-state transformation interfaces in general and growth interfaces
in massively transforming materials systems in particular. (C) 2001 Elsevie
r Science Ltd. All rights reserved.