Vv. Kulish et al., A fractional-diffusion theory for calculating thermal properties of thin films from surface transient thermoreflectance measurements, J HEAT TRAN, 123(6), 2001, pp. 1133-1138
The transient thermo reflectance (TTR) method consists of measuring changes
in the reflectivity of a material (thin film) tender pulsed laser heating,
and relating these changes to the corresponding surface temperature variat
ions. Analytical solutions of the diffusion problem are then used to determ
ine the thermal conductivity of the material following an iterative matchin
g process between the solutions and the experimental results. Analytical so
lutions are attainable either when the material absorbs the laser energy vo
lumetrically or when the material absorbs the laser energy at the surface.
Either solution allows for the determination of only one thermal property,
(thermal conductivity or diffusivity), with the other one assumed to be kno
wn. A new, single, analytical solution to the transient diffusion equation
with simultaneous surface and volumetric heating, found using fractional ca
lculus, is presented in a semi-derivative form. This complete solution prov
ides the means to determine the two thermal properties of the material (the
rmal conductivity and diffusivity) concomitantly. In this preliminary study
, the solution component for surface heating is validated by comparison wit
h experimental data for a gold sample using the classical thermoreflectance
method. Further results, for surface and volumetric heating, are obtained
and analyzed considering a GaAs sample.