Cl. Dai et al., Applied electrostatic parallelogram actuators for microwave switches usingthe standard CMOS process, J MICROM M, 11(6), 2001, pp. 697-702
This paper presents the fabrication of a laminated-suspension microwave swi
tch using a conventional 0.6 mum single polysilicon three metals complement
ary metal-oxide semiconductor process. The post-processing is completed wit
h maskless dry etching. The micromachined microwave switch consists of two
electrostatic parallelogram actuators, two T-type connectors and one coplan
ar waveguide on a p-type silicon. substrate. The switch only requires a low
dc voltage of around 18 V for electrostatic traction. The testing results
of the microwave switch show that the insertion loss is 6.8 dB and isolatio
n is -7.8 dB in the range 10-20 GHz. In addition to demonstrating the desig
n and fabrication of the microwave switch. this paper summarizes the experi
mental results.