A MEMS shield structure for controlling pull-in forces and obtaining increased pull-in voltages

Citation
H. Busta et al., A MEMS shield structure for controlling pull-in forces and obtaining increased pull-in voltages, J MICROM M, 11(6), 2001, pp. 720-725
Citations number
11
Categorie Soggetti
Mechanical Engineering
Journal title
JOURNAL OF MICROMECHANICS AND MICROENGINEERING
ISSN journal
09601317 → ACNP
Volume
11
Issue
6
Year of publication
2001
Pages
720 - 725
Database
ISI
SICI code
0960-1317(200111)11:6<720:AMSSFC>2.0.ZU;2-4
Abstract
By interposing a conductive shield with an opening between the movable micr oelectromechanical systems (MEMS) component and the substrate, it is possib le to control pull-in forces and to increase pull-in voltages. Modeling res ults for different opening diameters are presented for a planar structure a nd one that contains a field emitter tip. Pull-in voltages can be increased from about 2 V (with no shield) to about 12 V with a 7 mum diameter shield hole and to 25 V with a 2 mum shield hole. This shield technology will be demonstrated on a MEMS-activated field emitter amplifier in which the gate plate of a field emitter array is thermally activated and moves with respec t to the stationary tips. For a 6.7 mum diameter shield hole, the pull-in v oltage is 30 V. This higher voltage, as compared to the modeling results, i s caused by built-in stresses that curve the gate cantilever away from the substrate. In order for this concept to work, the field emitter operating v oltage has to be smaller than the gate pull-in voltage.