Collision of two interfaces of different roughnesses: a numerical study

Citation
Ev. Albano et Im. Irurzun, Collision of two interfaces of different roughnesses: a numerical study, J PHYS A, 34(45), 2001, pp. 9631-9639
Citations number
25
Categorie Soggetti
Physics
Journal title
JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL
ISSN journal
03054470 → ACNP
Volume
34
Issue
45
Year of publication
2001
Pages
9631 - 9639
Database
ISI
SICI code
0305-4470(20011116)34:45<9631:COTIOD>2.0.ZU;2-2
Abstract
In the classical Eden model (EM) the growing sites have the same probabilit y of becoming occupied and the growing process in (1 + 1) dimensions leads to the formation of a self-affine aggregate with a growing exponent beta (E M) = 1/3 and a roughness exponent alpha (EM) = 1/2. A generalization of the EM is proposed and studied, such that the growing probability now depends on the distance to the interface. This new model is called the unstable Ede n model (UEM) because, within the short time regime, it exhibits an unstabl e growth mode with a growing exponent beta (UEM) > 1/2. However, in the asy mptotic time regime the interface becomes stabilized and a roughness expone nt alpha (UEM) = 1 can be defined. In contrast to the EM, the interface of the UEM is no longer self-affine. Based on extensive numerical simulations it is concluded that the interface generated by the collision between the E M and the UEM is characterized by a roughness exponent alpha (coll) = alpha (UEM) = 1.