In the classical Eden model (EM) the growing sites have the same probabilit
y of becoming occupied and the growing process in (1 + 1) dimensions leads
to the formation of a self-affine aggregate with a growing exponent beta (E
M) = 1/3 and a roughness exponent alpha (EM) = 1/2. A generalization of the
EM is proposed and studied, such that the growing probability now depends
on the distance to the interface. This new model is called the unstable Ede
n model (UEM) because, within the short time regime, it exhibits an unstabl
e growth mode with a growing exponent beta (UEM) > 1/2. However, in the asy
mptotic time regime the interface becomes stabilized and a roughness expone
nt alpha (UEM) = 1 can be defined. In contrast to the EM, the interface of
the UEM is no longer self-affine. Based on extensive numerical simulations
it is concluded that the interface generated by the collision between the E
M and the UEM is characterized by a roughness exponent alpha (coll) = alpha
(UEM) = 1.