Hk. Kim et al., Electrochemical and structural properties of radio frequency sputtered cobalt oxide electrodes for thin-film supercapacitors, J POWER SOU, 102(1-2), 2001, pp. 167-171
Citations number
21
Categorie Soggetti
Physical Chemistry/Chemical Physics","Environmental Engineering & Energy
The electrochemical and structural properties of cobalt oxide films which a
re deposited at different sputtering gas-ratios Of O-2/(Ar + O-2) are inves
tigated. In order to examine the electrochemical properties of the as-depos
ited films, all solid-state thin-film. supercapacitors (TFSCs) are fabricat
ed. There Consist Of Co3O4 electrodes and an amorphous LiPON thin-film elec
trolyte. It is shown that the capacitance behaviour of the Co3O4/LiPON/Co3O
4 TFSCs is similar to bulk-type supercapacitor behaviour. It is further sho
wn that the electrochemical behaviour of the TFSCs is dependent on the sput
tering gas-ratios. The gas-ratio dependence of the capacitance of the oxide
electrode films is discussed based on X-ray diffraction (XRD) and electric
al results for the Co3O4 films. (C) 2001 Published by Elsevier Science B.V.