Citation
S. Krnac et al., RESPONSE OPERATOR IN SEMICONDUCTOR GAMMA-RAY SPECTROMETRY, Journal of radioanalytical and nuclear chemistry, 209(2), 1996, pp. 367-371
Citations number
6
Categorie Soggetti
Chemistry Analytical","Nuclear Sciences & Tecnology","Chemistry Inorganic & Nuclear
Journal title
ISSN journal
02365731
Volume
209
Issue
2
Year of publication
1996
Pages
367 - 371
Database
ISI
SICI code
0236-5731(1996)209:2<367:ROISGS>2.0.ZU;2-1
Abstract
A response operator technique for analysis of semiconductor gamma-ray
spectra utilizing vector model of scaling confirmatory factor analysis
(SCFA) is presented. It has been pointed out that the new vector SCFA
approach yields a noticeable rise of sensitivy of the semiconductor m
ethod for a great deal of spectrometric applications. it results to co
nsiderable detection limit decreasing (4-10 times for MSA) as compared
to the commonly used traditional approach (peak net area calculation
of full energy peak).