Electron density distribution in amorphous se determined by reverse Monte Carlo simulation coupled with anomalous X-ray scattering data

Authors
Saito, M Waseda, Y
Citation
M. Saito et Y. Waseda, Electron density distribution in amorphous se determined by reverse Monte Carlo simulation coupled with anomalous X-ray scattering data, MATER TRANS, 42(10), 2001, pp. 2071-2074
Citations number
11
Categorie Soggetti
Material Science & Engineering
Journal title
MATERIALS TRANSACTIONS
ISSN journal
13459678 → ACNP
Volume
42
Issue
10
Year of publication
2001
Pages
2071 - 2074
Database
ISI
SICI code
1345-9678(200110)42:10<2071:EDDIAS>2.0.ZU;2-5
Abstract
The ion-electron structure factor estimated from the anomalous X-ray scatte ring measurements near the Se K absorption edge has been used in the revers e Monte Carlo (RMC) simulation for determining the valence electron density distribution in amorphous Se. The results clearly indicate that the origin of particular valence electron distribution for Se can be explained by two non-bonding electrons and two bonding electrons.