A hybrid holographic microscope is proposed to realize both imaging and int
erferometric measurement of microstructures and meet the two major challeng
es in micromeasurement, which are high resolution and small object size. Th
e system is developed based on an in-line digital holographic arrangement i
ncorporated with a long-distance microscope. Studies demonstrate that it is
capable of realizing measurement of microstructures with lateral dimension
s of at least 5 mum. The application of the system in micromeasurement is e
xperimentally investigated on a microcantilever. The load-induced deflectio
n is obtained and validated with numerically simulated results based on a f
inite element model. Error analysis for displacement determination is perfo
rmed. (C) 2001 Society of Photo-Optical Instrumentation Engineers.