Comparative study of wavelet thresholding methods for denoising electronicspeckle pattern interferometry fringes

This paper presents a comparative study of different thresholding methods f or speckle noise reduction in electronic speckle pattern interferometry fri nges using several wavelet bases. An approach based on the removal of the w avelet subbands of the transformed image is presented. The performance of t his method is analyzed and compared with the results obtained with the deno ising techniques that use wavelet shrinkage. It is shown that the wavelet s ubband removal method reduces speckle noise and maintains image features mo re effectively than the wavelet shrinkage techniques based on soft and hard thresholding. (C) 2001 Society of Photo-Optical Instrumentation Engineers.