Differential phase measurements in low-coherence interferometry without 2 pi ambiguity

Citation
Ck. Hitzenberger et al., Differential phase measurements in low-coherence interferometry without 2 pi ambiguity, OPTICS LETT, 26(23), 2001, pp. 1864-1866
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS LETTERS
ISSN journal
01469592 → ACNP
Volume
26
Issue
23
Year of publication
2001
Pages
1864 - 1866
Database
ISI
SICI code
0146-9592(200112)26:23<1864:DPMILI>2.0.ZU;2-3
Abstract
Quantitative phase measurements by low-coherence interferometry and optical coherence tomography are restricted by the well-known 2 pi ambiguity to pa th-length differences smaller than lambda /2. We present a method that over comes this ambiguity. Introducing a slight dispersion imbalance between ref erence and sample arms of the interferometer causes the short and long wave lengths of the source spectrum to separate within the interferometric signa l. This causes the phase slope to vary within the signal. The phase-differe nce function between two adjacent sample beam components is calculated by s ubtraction of their phase functions obtained from phase-sensitive interfero metric signal recording. Because of the dispersive effect, the phase differ ence varies across the interferometric signal. The slope of that phase diff erence is proportional to the optical path difference, without 2 pi ambigui ty. (C) 2001 Optical Society of America.