M. Thirumal et Ak. Ganguli, Phase analysis and dielectric properties of oxides obtained in the MgO-(1-x)Nb2O5-(x)Ta2O5, P I A S-CH, 113(5-6), 2001, pp. 603-610
Citations number
6
Categorie Soggetti
Chemistry
Journal title
PROCEEDINGS OF THE INDIAN ACADEMY OF SCIENCES-CHEMICAL SCIENCES
MgNb2-xTaxO6 (0 less than or equal to x less than or equal to 2) phases can
be obtained as the major phase (75 to 90%) by solid state reactions starti
ng from oxides. These oxides crystallize in the orthorhombic columbite stru
cture till x = 1.75 and the tetragonal triutile structure for MgTa2O6 (x =
2.0). For all the compositions there exist secondary phases like Nb2O5 or T
a2O5 in addition to the major AB(2)O(6) phase. Sintered disks (1200 degrees
C) show dielectric constants varying between 14.8 and 16.0 for the entire r
ange of composition at a frequency of 500 kHz. The dielectric loss is nearl
y constant around 0.025 to 0.03 between 0 less than or equal to x less than
or equal to 1 but increases to 0.17 for the MgTa2O6 phase (x = 2.0). Scann
ing electron micrographs reveal a gradual decrease in grain size with incre
ase in Ta concentration with a size of 3 micron for the x = 0 composition (
sintered at 1200 degreesC) while the x = 2 phase shows a grain size of appr
oximately 0.5 microns. The microwave dielectric constant at similar to 14 G
Hz is found to be 20.9 for the x = 0 composition and 17.7 for the x = 2 com
position.