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ITA
ENG
X-ray study of the kinetics of thick-layer pulse anodizing of aluminum
Authors
Baskakov, AV
Lyasnikov, VN
Seryanov, YV
Surov, YI
Citation
Av. Baskakov et al., X-ray study of the kinetics of thick-layer pulse anodizing of aluminum, PROT MET R, 37(6), 2001, pp. 569-571
Citations number
5
Categorie Soggetti
Metallurgy
Journal title
PROTECTION OF METALS
ISSN journal
00331732 →
ACNP
Volume
37
Issue
6
Year of publication
2001
Pages
569 - 571
Database
ISI
SICI code
0033-1732(200111/12)37:6<569:XSOTKO>2.0.ZU;2-3
Abstract
Highly efficient infralow-frequency conditions of a thick-layer insulative anodizing of aluminum and its alloys is substantiated and developed for man ufacturing printed boards and integrated circuits.