Electronic properties of Si delta-doped GaAs under an applied electric field

Citation
E. Ozturk et al., Electronic properties of Si delta-doped GaAs under an applied electric field, SEMIC SCI T, 16(6), 2001, pp. 421-426
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
16
Issue
6
Year of publication
2001
Pages
421 - 426
Database
ISI
SICI code
0268-1242(200106)16:6<421:EPOSDG>2.0.ZU;2-#
Abstract
We have theoretically investigated the electronic structure of Si delta -do ped GaAs inserted into a quantum well under an applied electric field. For uniform distribution we have studied the influence of the electric field on the donor concentration. The electronic properties such as the effective p otential. the density profile, the subband energies, the subband occupation s and the Fermi energy level have been calculated by solving the Schrodinge r and Poisson equations self-consistently. From our calculations, we have s een that the change of the electronic properties as dependent on the applie d electric field is more pronounced at low doping concentration. The high e lectric fields can induce a spatial separation between confined electrons a nd ionized dopants in the delta -doped GaAs structure, resulting in enhance d free-carrier mobility in devices.