Experimental study of the hot-carrier impact ionization photovoltaic effect in pulsed CO2-laser-excited silicon junctions

Citation
F. Encinas-sanz et al., Experimental study of the hot-carrier impact ionization photovoltaic effect in pulsed CO2-laser-excited silicon junctions, SEMIC SCI T, 16(6), 2001, pp. 463-466
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
16
Issue
6
Year of publication
2001
Pages
463 - 466
Database
ISI
SICI code
0268-1242(200106)16:6<463:ESOTHI>2.0.ZU;2-0
Abstract
An experimental study has been carried out on the dependence of the hot-car rier highly nonlinear photovoltaic effect induced in silicon n(+)/p junctio ns by 10.6 mum laser pulses on the doping level and the carrier density pro file. The measured response is optimized by using narrow step junctions and a high doping level n(+) approximate to 10(20) cm(-3) The main features of the obtained results can be qualitatively interpreted by taking the follow ing into account: conditions for a thermalized hot-carrier plasma, generati on rate by impact ionization processes, generated minority diffusion curren t and recombination and absorption losses.