Multiple ionization in quantitative XRF

Authors
Ebel, H Svagera, R Ebel, MF
Citation
H. Ebel et al., Multiple ionization in quantitative XRF, X-RAY SPECT, 30(3), 2001, pp. 139-142
Citations number
11
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
X-RAY SPECTROMETRY
ISSN journal
00498246 → ACNP
Volume
30
Issue
3
Year of publication
2001
Pages
139 - 142
Database
ISI
SICI code
0049-8246(200105/06)30:3<139:MIIQX>2.0.ZU;2-N
Abstract
The influence of the neglect of multiple ionizations in quantitative XRF wi thout standards is demonstrated by computer simulation and evaluation of ch aracteristic x-ray signals of binary bulk specimens of Al and Cu. An error of up to 4 wt% can be expected. Copyright (C) 2001 John Wiley gr Sons, Ltd.