Elemental mapping using proton-induced x-rays

Citation
Wj. Przybylowicz et al., Elemental mapping using proton-induced x-rays, X-RAY SPECT, 30(3), 2001, pp. 156-163
Citations number
27
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
X-RAY SPECTROMETRY
ISSN journal
00498246 → ACNP
Volume
30
Issue
3
Year of publication
2001
Pages
156 - 163
Database
ISI
SICI code
0049-8246(200105/06)30:3<156:EMUPX>2.0.ZU;2-F
Abstract
The use of particle-induced x-ray emission (PIXE) in conjunction with a sca nning nuclear microprobe (SNM) offers one of the few microanalytical techni ques capable of studies of elemental concentrations at the ppm level, with a spatial resolution of the order of 1 mum. Beam scanning capabilities and advanced data treatment make it a technique of choice for quantitative two- dimensional studies of elemental distribution. Although the ultimate aim is to obtain true quantitative elemental maps, free of concentration or thick ness artifacts, some compromises are necessary owing to experimental and co mputational restrictions. Some approaches currently used are discussed with emphasis on true elemental imaging using the dynamic analysis method. Exam ples of applications in geology and biology are shown to illustrate its ben efits and limitations. Copyright (C) 2001 John Wiley & Sons, Ltd.