Field distribution within coaxial scanning near-field optical microscope tips

Citation
F. Demming et al., Field distribution within coaxial scanning near-field optical microscope tips, ADV FUNCT M, 11(3), 2001, pp. 198-201
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
ADVANCED FUNCTIONAL MATERIALS
ISSN journal
1616301X → ACNP
Volume
11
Issue
3
Year of publication
2001
Pages
198 - 201
Database
ISI
SICI code
1616-301X(200106)11:3<198:FDWCSN>2.0.ZU;2-U
Abstract
Since the development of the first scanning near-field optical microscope g reat effort has been put into the development of nearfield optical probe ti ps that have both a good lateral resolution, in the range of several tens o f nanometers, and a high power throughput. Several groups have proposed the use of scanning near-field optical tips with a coaxial structure. From ele ctromagnetic theory it is well known that such structures can attain power transmissions of close to one and they do not have a cut-off frequency. In this paper we discuss some questions concerning the stimulation of optical coaxial modes and their propagation behavior.