Evidence of isoelectronic traps in molecular beam epitaxy grown Zn1-xBexSe: Temperature- and pressure-dependent photoluminescence studies

Citation
Bs. Kim et al., Evidence of isoelectronic traps in molecular beam epitaxy grown Zn1-xBexSe: Temperature- and pressure-dependent photoluminescence studies, APPL PHYS L, 78(26), 2001, pp. 4151-4153
Citations number
29
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
26
Year of publication
2001
Pages
4151 - 4153
Database
ISI
SICI code
0003-6951(20010625)78:26<4151:EOITIM>2.0.ZU;2-P
Abstract
We have studied undoped Zn1-xBexSe alloys grown by molecular beam epitaxy b y photoluminescence (PL) as a function of temperature and pressure. We sugg est that there are isoelectronic excitonic traps in this material. The bind ing energy of the isoelectronic bound excitons is deep, between 40 and 50 m eV. We have also shown that the temperature and pressure dependences of the Zn1-xBexSe PL are close to those of ZnSe. From this we conclude that the d ominant excitonic recombination is of an "effective mass" type. (C) 2001 Am erican Institute of Physics.