Robustness of ultrathin aluminum oxide dielectrics on Si(001) (vol 78, pg 2670, 2001)

Authors
Copel, M Cartier, E Gusev, EP Guha, S Bojarczuk, N Poppeller, M
Citation
M. Copel et al., Robustness of ultrathin aluminum oxide dielectrics on Si(001) (vol 78, pg 2670, 2001), APPL PHYS L, 78(26), 2001, pp. 4199-4199
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
26
Year of publication
2001
Pages
4199 - 4199
Database
ISI
SICI code
0003-6951(20010625)78:26<4199:ROUAOD>2.0.ZU;2-L