Electroluminescence from a forward-biased Schottky barrier diode on modulation Si delta-doped GaAs/InGaAs/AlGaAs heterostructure

Citation
A. Babinski et al., Electroluminescence from a forward-biased Schottky barrier diode on modulation Si delta-doped GaAs/InGaAs/AlGaAs heterostructure, APPL PHYS L, 78(25), 2001, pp. 3992-3994
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
25
Year of publication
2001
Pages
3992 - 3994
Database
ISI
SICI code
0003-6951(20010618)78:25<3992:EFAFSB>2.0.ZU;2-S
Abstract
Electroluminescence (EL) from a forward-biased Schottky barrier diode on mo dulation Si delta -doped pseudomorphic GaAs/InGaAs/AlGaAs heterostructure w ith high mobility electron gas,is investigated in this work. It has been fo und that the EL from the InGaAs quantum well can be observed at temperature s up to 90 K. The EL line shape depends on the current density, which refle cts the filling of the InGaAs channel with electrons. The total integrated EL intensity depends linearly on the current density. We propose that hole diffusion from an inversion layer at the Schottky barrier is responsible fo r the observed optical recombination with electrons in the InGaAs quantum w ell. (C) 2001 American Institute of Physics.