Scanning impedance microscopy of electroactive interfaces (vol 78, pg 1306, 2001)

Authors
Kalinin, SV Bonnell, DA
Citation
Sv. Kalinin et Da. Bonnell, Scanning impedance microscopy of electroactive interfaces (vol 78, pg 1306, 2001), APPL PHYS L, 78(25), 2001, pp. 4046-4046
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
25
Year of publication
2001
Pages
4046 - 4046
Database
ISI
SICI code
0003-6951(20010618)78:25<4046:SIMOEI>2.0.ZU;2-D