Self-dual self-testing multicycle circuits: Their properties

Authors
Gessel, M Dmitriev, AV Sapozhnikov, VV Sapozhnikov, VV
Citation
M. Gessel et al., Self-dual self-testing multicycle circuits: Their properties, AUT REMOT R, 62(4), 2001, pp. 642-652
Citations number
12
Categorie Soggetti
AI Robotics and Automatic Control
Journal title
AUTOMATION AND REMOTE CONTROL
ISSN journal
00051179 → ACNP
Volume
62
Issue
4
Year of publication
2001
Pages
642 - 652
Database
ISI
SICI code
0005-1179(200104)62:4<642:SSMCTP>2.0.ZU;2-E
Abstract
Functional testing of memory circuits based on the properties of self-dual functions and a procedure for transforming the initial circuit into a self- dual circuit are described. Experimental results for MCNC benchmark circuit s are given.