Fast modelling of the optical characteristics of electroluminescent pixel structures

Citation
J. Rudiger et al., Fast modelling of the optical characteristics of electroluminescent pixel structures, IEE P-OPTO, 148(2), 2001, pp. 101-105
Citations number
6
Categorie Soggetti
Optics & Acoustics
Journal title
IEE PROCEEDINGS-OPTOELECTRONICS
ISSN journal
13502433 → ACNP
Volume
148
Issue
2
Year of publication
2001
Pages
101 - 105
Database
ISI
SICI code
1350-2433(200104)148:2<101:FMOTOC>2.0.ZU;2-S
Abstract
An analytic model of the optical behaviour of laterally light emitting thin film structures is developed. It is employed to calculate the outcoupled l ight of a pixel used in light emitting dot matrix displays such as laterall y emitting thin film electroluminescent displays (LETFEL) with micromirrors . Consequently, one can identify the optimum pixel geometry. Here, the opti cal behaviour of the circular, square and hexagonal pixel geometry is model led. The presented closed form solutions are based on a ray optics approxim ation whereby the absorption of the light within the light generating mediu m (phosphor material) and the transmission behaviour of the phosphor-air in terface is taken into account, as well as the micromirror width. These solu tions, however, neglect back reflected light. The effect of this neglect is investigated for square pixels by taking into account the first reflection . The model is applied to a typical LETFEL display with ZnS material doped with Mn. An optimal pixel diameter of 35 mum is estimated for that particul ar type of display.