Yg. Ju et al., STRONG POLARIZATION SELECTIVITY IN 780-NM VERTICAL-CAVITY SURFACE-EMITTING LASERS GROWN ON MISORIENTED SUBSTRATES, Applied physics letters, 71(6), 1997, pp. 741-743
We report that the 780 nm quantum well vertical-cavity surface-emittin
g lasers (VCSELs) grown on a 2 degrees off misoriented (001) substrate
toward (111)A exhibit a high polarization suppression ratio over a fe
w hundred. The main polarization is always along the [-110] direction
for all the lasers over the entire operating currents. To understand t
he physical origin of this polarization selectivity, the gain/loss dif
ference between two competing polarization modes in VCSELs is investig
ated by measuring the subthreshold spectral linewidth. The obtained mo
dal gain/loss difference is about 3.0 cm(-1), which is sufficiently la
rge for polarization stabilization and amounts to 4% of the threshold
modal gain. Comparison with the subthreshold measurement and previous
theoretical work shows significant discrepancy, which implies the poss
ibility of other polarization selection mechanisms inducing such large
gain/loss differences in 780 nm quantum wells grown on a misoriented
substrate. In addition, it is found that the 780 nm VCSEL made of a bu
lk active medium grown on a misoriented substrate also shows a high po
larization selectivity as quantum well lasers. (C) 1997 American Insti
tute of Physics.