Le. Ocola et al., SYNCHROTRON-RADIATION MICRO-FOURIER TRANSFORM-INFRARED SPECTROSCOPY APPLIED TO PHOTORESIST IMAGING, Applied physics letters, 71(6), 1997, pp. 847-849
The application of a micro-Fourier transform infrared, (mu-FTIR), spec
troscopic system, using synchrotron radiation as a light source, for p
hotoresist chemical analysis has been investigated. The better signal
to noise due to the high brightness of the infrared radiation from the
synchrotron permits higher spatial resolution scans than with a conve
ntional glowbar. This permits a new technique of mu-FTIR spectroscopy,
which potentially can get close to diffraction limited resolution, wi
th high chemical sensitivity, for mid-IR wavelengths ranging from 2.3
mu m (4400 cm(-1)) to 9 mu m (1100 cm(-1)). An example of application
of imaging the local chemistry changes of a chemically amplified photo
resist with post-exposure bake shows the exciting capability of this t
echnique for nondestructive resist exposure process control. (C) 1997
American Institute of Physics.