SYNCHROTRON-RADIATION MICRO-FOURIER TRANSFORM-INFRARED SPECTROSCOPY APPLIED TO PHOTORESIST IMAGING

Citation
Le. Ocola et al., SYNCHROTRON-RADIATION MICRO-FOURIER TRANSFORM-INFRARED SPECTROSCOPY APPLIED TO PHOTORESIST IMAGING, Applied physics letters, 71(6), 1997, pp. 847-849
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
71
Issue
6
Year of publication
1997
Pages
847 - 849
Database
ISI
SICI code
0003-6951(1997)71:6<847:SMTSA>2.0.ZU;2-D
Abstract
The application of a micro-Fourier transform infrared, (mu-FTIR), spec troscopic system, using synchrotron radiation as a light source, for p hotoresist chemical analysis has been investigated. The better signal to noise due to the high brightness of the infrared radiation from the synchrotron permits higher spatial resolution scans than with a conve ntional glowbar. This permits a new technique of mu-FTIR spectroscopy, which potentially can get close to diffraction limited resolution, wi th high chemical sensitivity, for mid-IR wavelengths ranging from 2.3 mu m (4400 cm(-1)) to 9 mu m (1100 cm(-1)). An example of application of imaging the local chemistry changes of a chemically amplified photo resist with post-exposure bake shows the exciting capability of this t echnique for nondestructive resist exposure process control. (C) 1997 American Institute of Physics.