Investigation of adsorption and absorption-induced stresses using microcantilever sensors

Citation
Zy. Hu et al., Investigation of adsorption and absorption-induced stresses using microcantilever sensors, J APPL PHYS, 90(1), 2001, pp. 427-431
Citations number
37
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
90
Issue
1
Year of publication
2001
Pages
427 - 431
Database
ISI
SICI code
0021-8979(20010701)90:1<427:IOAAAS>2.0.ZU;2-W
Abstract
The interaction between a vapor and a thin film adsorbed on one side of a b imaterial microcantilever produces differential stress, resulting in readil y measurable curvatures of the cantilever structure. Depending upon the sys tem studied, there exist two types of gas-solid interaction: bulk-like abso rption and surface-like adsorption. The absorption of hydrogen into palladi um results in film expansion whose magnitude is governed by hydrogen partia l pressure. The bending of a bimaterial microcantilever (palladium/silicon) due to hydrogen absorption depends on the thickness of the palladium film and is reversible but rate limited by a surface barrier. In contrast, the s tress induced by adsorption of mercury onto a bimaterial (gold/silicon) can tilever is irreversible at room temperature, is rate limited by surface cov erage, and is independent of the gold-film thickness. (C) 2001 American Ins titute of Physics.