Stereoelectronic effects in the Si-C bond: A study of the molecular structure and conformation of tetraphenylsilane by gas-phase electron diffractionand theoretical calculations
Ar. Campanelli et al., Stereoelectronic effects in the Si-C bond: A study of the molecular structure and conformation of tetraphenylsilane by gas-phase electron diffractionand theoretical calculations, J PHYS CH A, 105(24), 2001, pp. 5933-5939
The molecular structure and conformation of tetraphenylsilane have been inv
estigated by gas-phase electron diffraction and ab initio/DFT and molecular
mechanics calculations. The structure of the free molecule is consistent w
ith an Sq symmetry conformation; the calculations indicate that the twist a
ngle tau between the plane of the phenyl group and the plane defined by the
Si-C bond and the Sq axis is about 40 degrees. Analysis of the low-frequen
cy modes indicates that the four phenyl groups undergo large-amplitude tors
ional and bending vibrations about the respective Si-C bonds. The electron
diffraction intensities from a previous study [Csakvari, E.; Shishkov, I. F
.; Rozsondai, B.; Hargittai, I. J. Mel. Struct. 1990, 239, 291] have been r
eanalyzed, using constraints from the calculations. A dynamical model accou
nting for the large-amplitude bending motion of the phenyl groups was used
in the refinement: The new analysis yields accurate values for the twist an
gle of the phenyl group, tau = 40 +/- 2 degrees, and the Si-Ph bond length,
r(g) = 1.881 +/- 0.004 Angstrom. The Si-Ph bond in tetraphenylsilane is ma
rginally longer than the Si-Me bond in tetramethylsilane, r(g) = 1.877 +/-
0.004 Angstrom from the analysis of electron diffraction data taken with th
e same apparatus. This contrasts with chemical expectation, which would sug
gest a difference of 0.03 Angstrom in the opposite sense, based on the cova
lent radii of C(sp(3)) and C(sp(2)). A delicate balance of subtle stereoele
ctronic effects, involving electron delocalization into the sigma*-(Si-C) a
nd 3d(Si) orbitals, appears to be responsible for the nearly equal length o
f the Si-C bonds in the two molecules. Other bond lengths from the present
electron diffraction study are <r(g)(C-C)> = 1.401 +/- 0.003 Angstrom and <
r(g)(C-H)> = 1.102 +/- 0.003 Angstrom. The ipso ring angle of the phenyl gr
oups is 117.5 degrees from the DFT calculations, in close agreement with so
lid-state results.