Hs. Ko et al., A study on the adhesion enhancement of polyetherimide to Si wafer using anAl-chelate treatment during multichip module fabrication, MAT SCI E B, 83(1-3), 2001, pp. 111-118
Al-chelate coupling agent was successfully applied to improve the adhesion
strength of a thermoplastic polyetherimide resin, Ultem 1000 (R) to a silic
on wafer during the fabrication of multichip module (MCM) substrates, The o
rigin of the enhanced adhesion strength achieved by applying Al chelate was
also investigated using a surface characterization experiment and a theore
tical approach. The peel strength of as-laminated Ultem film on an untreate
d Si wafer was the same as that on a coupler-treated one right after lamina
tion. However, the Ultem layer laminated on an untreated Si wafer lost its
adhesion strength to zero within 24 h of 85 degrees /85% relative humidity
(RH) aging. In contrast, the Ultem film laminated on the coupler-treated Si
wafer maintained its adhesion strength even after 30 days of 85 degreesC/8
5% RH treatment. Atomic force microscopy (AFM), surface energy calculation
using contact angle measurement, and high-resolution X-ray photoelectron sp
ectroscopy (XPS) analysis were conducted to characterize the surface condit
ions of a bare Si wafer and a coupler-treated Si wafer. It was revealed by
the AFM experiment that the surface roughening caused by Al-chelate treatme
nt was negligible, meaning that the enhanced adhesion stability during 85 d
egreesC/85% RH aging is mainly attributed to the surface characteristic cha
nge of Si substrate. Based on the results of XPS analysis and contact angle
measurement, a model of surface bonding structure of an Al-chelate treated
Si wafer was suggested and compared with that of a bare Si wafer. Finally,
peel strength variation of Si wafers with and without the coupling agent a
s a function of 85 degreesC/85% RH aging times can be explained by the zero
point of charge consideration. Stable lamination based MCMs and micro-via
build-up processes can also be obtained using these results. (C) 2001 Elsev
ier Science B.V. All rights reserved.