Silicon-on-insulator power integrated circuits

Citation
Dm. Garner et al., Silicon-on-insulator power integrated circuits, MICROELEC J, 32(5-6), 2001, pp. 517-526
Citations number
13
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS JOURNAL
ISSN journal
00262692 → ACNP
Volume
32
Issue
5-6
Year of publication
2001
Pages
517 - 526
Database
ISI
SICI code
0026-2692(200105/06)32:5-6<517:SPIC>2.0.ZU;2-M
Abstract
A power integrated circuit process has been developed, based on silicon-on- insulator, which allows intelligent CMOS control circuitry to be placed alo ngside integrated high-voltage power devices. A breakdown voltage of 335 V has been obtained by using a silicon layer of 4 mum thickness together with a buried oxide layer of 3 mum thickness. The respective LDMOS specific on- resistance and LIGBT on-state voltage for this breakdown voltage were 148 m Omega cm(2) and 3.9 V, respectively. (C) 2001 Published by Elsevier Scienc e Ltd. All rights reserved.