Monolithic integration of a high-performance clustered insulated gate bipolar transistor with low-voltage components to form a 3 kV intelligent powerchip

Citation
M. Sweet et al., Monolithic integration of a high-performance clustered insulated gate bipolar transistor with low-voltage components to form a 3 kV intelligent powerchip, MICROELEC J, 32(5-6), 2001, pp. 527-536
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS JOURNAL
ISSN journal
00262692 → ACNP
Volume
32
Issue
5-6
Year of publication
2001
Pages
527 - 536
Database
ISI
SICI code
0026-2692(200105/06)32:5-6<527:MIOAHC>2.0.ZU;2-U
Abstract
For the first time, we evaluate the feasibility of monolithic integration o f low-voltage components, such as n and p channel MOSFETs, into a 3 kV nove l planar power semiconductor device, called the clustered insulated gate bi polar transistor, to realise an intelligent power chip. The power device em ploys MOS control with a thyristor to lower the on-state conduction losses and a unique self-clamping feature that provides current saturation at high gate voltages and enables the incorporation of low-voltage devices without any additional processing. This combination paves the way for realising an intelligent power chip with enhanced performance with respect to on-chip t emperature, overcurrent and over-voltage protection circuitry. (C) 2001 Pub lished by Elsevier Science Ltd. All rights reserved.