Random energy loss and straggling study of Li into Si

In the present work we have measured the random Li-7 stopping power and ran ge straggling into Si. With this aim we have employed the Rutherford backsc attering (RBS) technique together with a multilayer Sb/Si marker. The stopp ing power measurements were performed in the 280-8500 keV energy interval, while the range straggling ones were done in the 380-2500 keV energy interv al. The present results were compared with the TRIM predictions and the sem i-empirical calculations by the Kalbitzer group, and an overall good agreem ent was found for both cases. (C) 2001 Elsevier Science B.V. All rights res erved.