Self-ion-induced swelling of germanium

Citation
B. Stritzker et al., Self-ion-induced swelling of germanium, NUCL INST B, 175, 2001, pp. 193-196
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
175
Year of publication
2001
Pages
193 - 196
Database
ISI
SICI code
0168-583X(200104)175:<193:SSOG>2.0.ZU;2-4
Abstract
Ge substrates of (1 0 0) orientation were irradiated with 1.0 MeV Ge ions a t temperatures in the range from -180 degreesC to 500 degreesC. Pronounced swelling of the irradiated material up to 4000 Angstrom, associated with th e formation of a porous surface layer, was evident only for temperatures be tween -50 degreesC and 200 degreesC. The extent of swelling was found to be insensitive to temperature in this range and exhibited an approximately li near dose dependence for doses up to 1 x 10(17) Ge cm(-2). For temperatures outside this range, only sputtering effects were observed. The structure o f the porous surface layer was examined by transmission electron microscopy . For samples irradiated at 22 degreesC, it was shown to have a density sim ilar to 30% that of bulk Ge. These layers were further shown to be stable d uring subsequent annealing to 500 degreesC, (C) 2001 Elsevier Science B.V. All rights reserved.