Probe-surface interaction in a piezoresonator "shear force" microscope

Authors
Biryukov, AV Gaponov, SV Mironov, VL Volgunov, DG
Citation
Av. Biryukov et al., Probe-surface interaction in a piezoresonator "shear force" microscope, PHYS LOW-D, 3-4, 2001, pp. 17-23
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICS OF LOW-DIMENSIONAL STRUCTURES
ISSN journal
02043467 → ACNP
Volume
3-4
Year of publication
2001
Pages
17 - 23
Database
ISI
SICI code
0204-3467(2001)3-4:<17:PIIAP">2.0.ZU;2-T
Abstract
We discuss the features of probe-surface interaction in an atomic-force "sh ear force" microscope involving a resonance piezoelectric sensor of force, It has been established that the behaviour of the amplitude-frequency chara cteristics of the piezosensor when probe is being brought closer to the sam ple largely depends on the state and properties of the surface. It is shown that reliable non-contact operation of a "shear force" microscope requires usage of high-Q piezosensors (Q > 500).